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155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors

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155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors

155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors
155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors

Large Image :  155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors

Product Details:
Place of Origin: China
Brand Name: Komeg
Certification: CE approval
Model Number: Hast -55
Payment & Shipping Terms:
Minimum Order Quantity: 1pcs
Price: Negotiation
Packaging Details: rigid poly foam and wooden box
Delivery Time: 35 day after confirm the order
Payment Terms: L/C, T/T, Western Union
Supply Ability: 100pcs /day
Detailed Product Description
Temp Range: +105℃~+135℃ Temp Deviation: ≦ ± 0.5℃
Pressure Range: Gauge Pressure: +0.2 ~ 200Kpa *Absolute Pressure: 100 ~ 300Kpa Interior Material: Stainless Steel
Exterior Material: Baked Painting Steel Heating Uptime: 0.7℃~1.0℃/minutes(Average )
High Light:

IC Semiconductors Aging Test Chamber

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155L Aging Test Chamber

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IC Semiconductors Hast Test Chamber

Climatic Halt /Hast Aging Test Chamber For Ic Semiconductors

HAST-55-Specification (2).pdf

 

155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 0

 

 

Volume and dimension

 

2.1 Volume About 155L
2.2 Interior size Ø550 mm*D650mm(Drum type pressure inner box)
2.3 Exterior size

W900 mm*H1552mm*D1500 mm(Excluding the protruding part of the machine!)

Tips: For external dimensions, please confirm the three views according to the final design!

3. The main technical parameters

3.1 Test Conditions

Cool method: :Natural cooling or air purging

Measured at a room temperature of +25 ℃ under no load, Measured at normal pressure 101.3Kpa, the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit.

3.2 Temperature range +105℃~+135℃(At 100% relative humidity)
3.3Temp. fluctuation ±0.5℃
3.4Temp. uniformity ≤±3.0℃
3.5Temp. deviation ≤±3.0℃
3.6 Humidity range

1) HUM unsaturated test mode: 65~100%RH

2) STD saturation test mode: 100%RH

3.7 Humidity Fluctuation ±3.0%RH
3.8 Humidity Deviation ±5.0%RH
3.9 Temperature change rate

Heat up rate:

+25℃~+135℃, full range average speed approx 45 min (no-load,no heating)

3.10 Load no
  Note:Measured at a room temperature of +25 ℃ under no load,the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5 or IEC60068 -3; the sensor is placed at the air outlet of the air handling unit.
3.11 Pressure range

Gauge pressure: +0.2 ~ 200Kpa

*Absolute pressure: 100 ~ 300Kpa

3.12 Pressure deviation ≤±2 kPa
3.13 Pressure rise time Atmospheric pressure to 200Kpa 20min

 

Chamber construction

4.1 Construction type

Integral drum pressure vessel structure

Comply with national safety container standards

The inner box design of the drum prevents condensation on the top and dripping water

4.2 Insulation enclosure structure Outer spray plastic anti-corrosion electrolysis plate - intermediate insulation layer is temperature resistant foam insulation material - inner box SUS316 stainless steel plate

4.3 Exterior

material

High-quality anti-corrosion electrolytic board, surface electrostatic powder baking paint.,KOMEG standard color.
4.4 Interior material

SUS316 stainless steel; inner wall full-welded

 

4.5 Insulation Superfine glass wool insulation layer, flame retardant grade A1

4.6 Door

 

Single open the door, open to the left;

Flush-mounted rotary handle

4.10 Unit Water storage tank, cooling air outlet, automatic water replenishment pump, water replenishment solenoid valve, water level box, drain hole

 

Application :

It is widely used in IC semiconductors, connectors, circuit boards, magnetic materials, polymer materials, EVA, photovoltaic modules and other related products for accelerated aging life test

 

Product description

The purpose of the Highly Accelerated Aging Test (HAST) is to increase product environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. , The reliability of semiconductor products has improved. At present, most electronic devices can withstand long-term high temperature and high humidity deviation tests without failure. Therefore, the test time used to determine the quality of the finished product has also increased a lot. In the design stage of the product, it is used to quickly expose the defects and weaknesses of the product, and test the sealing and aging performance of its products.

 

Features:

 

◆ The inner tank adopts double-layer arc design, which can prevent the phenomenon of condensation and dripping in the test, so as to avoid the direct impact of superheated steam on the product in the test process and affect the test result.

◆ Using 7-inch true color touch screen, with 250 groups of 12,500 programs, with USB curve data download function, RS-485 communication interface.

◆ Using wet and dry bulb sensor for direct measurement (control modes are divided into three modes: dry and wet bulb, unsaturated and wet saturation).

 

Photos show 

155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 1

155L Climatic Halt Hast Aging Test Chamber For IC Semiconductors 2

 

Contact Details
KOMEG Technology Ind Co., Limited

Contact Person: Anna Hu

Tel: +8618098282716

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